TSP #29 - Teardown, Repair and Experiments of an Agilent 86120B Multi-Wavelength Meter
In this episode Shahriar repairs an Agilent 86120B Multi-Wavelength Meter. The instrument reports "E14 Data Acquisition Problem" which corresponds to a potential internal HeNe reference laser failure. After the instrument disassembly, the old HeNe laser is removed and its optical power is compared to that of a new laser. The measurements confirm that the old laser has significantly deteriorated in output light intensity. The new laser is fitted inside the unit and the error message is eliminated. The free-space optic portion of the instrument is revealed and the principle operation is reviewed. Various components of the Michelson Interferometer is examined.
To test the correct operation of the instrument, a single tone semiconductor laser is applied to the unit and the result is compared to a different wavelength meter. The concept behind the operation of a Fabry-Perot laser is also presented before the signal is applied to the wavelength meter.
In this episode, Shahriar upgrades an Agilent 53131A Universal Counter with the OPT-030 which extends its frequency range from 225MHz to 3GHz. The upgrade kit is a replica PCB intended to emulate the behavior of the original Agilent branded option.
The PCB is examined carefully with attention to microwave layout techniques along the signal path. The datasheet of all the parts are reviewed and the reverse-engineered block diagram of the PCB is presented. The expected behavior of the PCB is then measured in both small-signal and large-signal operation using an active 3GHz probe. The PCB is then installed inside the unit and the functionality of the instrument is verified within its specifications. All the documents presented in the video can be found at The Signal Path Blog.
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In this episode Shahriar investigates a peculiar problem with an Agilent P-Series Power Meter. While the instruments works during startup, after about 10 minutes the LCD screen begins to flicker and become scrambled. Initial investigation reveals that the issue is not likely with the main motherboard since USB connection to the instrument and data-readout is possible even when the LCD screen is malfunctioning.
Teardown of the unit reveals a modular design where a ribbon cable connects the front panel to the motherboard. Moving the cable around affect the LCD which points to a faulty cable connection. The failure is at the only ribbon cable without a proper removable connector to the motherboard. The cable is cut, re-crimped and the solder joints re-worked. This appears to solve the LCD problem. The performance of the unit is verified by measuring the output power of the Tektronix TSG Vector Signal Generator.
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In this episode Shahriar goes over the operation and principle theory behind Lock-in Amplifiers. The SRS SR530 is one of the most iconic lock-in amplifiers ever made and since it offers two channels it can be used to perform very interesting experiments across many domains. After reviewing the block diagram and equations governing the theory of operation, a brief instrument teardown is presented.
Two unique and interesting experiments are also presented. In the first experiment the instrument is used to measure the speed of light. This is accomplished by measuring the wavelength of sound at 20kHz using a pair of speakers and a function generator. The distance between the speakers can be carefully adjusted and the relative signal strength from each lock-in channel is measured and thus the wavelength can also be measured.
In the second experiment the sensitivity of a red LED to blue laser light is measured. Due to the semiconductor composition of the red LED as well as its red plastic casing, the responsibility of the LED to blue light is extremely low. A chopper is therefore used to lock the light to the lock-in amplifier's reference input. The measured induced current is measured down to very low optical level in the order of hundreds of fempto (10^-15)
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In this episode Shahriar takes a close look at the FLIR MR160 Thermal Imaging and Moisture Meter. Featuring Infrared Guided Measurement (IGM) technology powered by a FLIR Lepton® thermal imaging sensor, MR160 helps you quickly see temperature patterns that point to potential hidden moisture so you know right where to place the meter probe to capture accurate readings.
After an overview of the camera functions a full teardown of the instrument is presented. The FLIR MR160 is based on a single PIC32 processor with built-in capacitance measurement capability. The MR160 is then used to detect a moisture spot on a floor tiling. The presence of moisture is then verified with both the pin-less and pin-based moisture measurement capability of the MR160. Finally, the MR160 is also used to measure temperature variation across a bank of resistors.
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In this episode (Part 2/3) Shahriar discusses methods for generating a pulse-width-modulated (PWM) signal entirely in the analog domain by employing operational-amplifiers (Op-Amps). A total of four op-amps from a single power supply are used in unity-gain negative feedback, astable positive feedback, integrator and open-loop comparator configurations. The theory of operation as well as measurement are also presented. This episode also includes a quiz. Please post your answers in the comment section.
As a final experiment, an ignition coil is used to generate in excess of 20k volts! The combination of the PWM circuit and the ignition coil provides a stand-alone fully analog high voltage power supply.
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https://www.youtube.com/watch?v=K3Kxelhwx9I
In this episode (Part 3/3) Shahriar discusses methods for generating a pulse-width-modulated (PWM) signal entirely in the analog domain by employing operational-amplifiers (Op-Amps). A total of four op-amps from a single power supply are used in unity-gain negative feedback, astable positive feedback, integrator and open-loop comparator configurations. The theory of operation as well as measurement are also presented. This episode also includes a quiz. Please post your answers in the comment section.
As a final experiment, an ignition coil is used to generate in excess of 20k volts! The combination of the PWM circuit and the ignition coil provides a stand-alone fully analog high voltage power supply.
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https://www.youtube.com/watch?v=QkcsKOdzkQI
In this episode Shahriar examines a failed Agilent 1169A 12GHz Smart Active Probe. The probe does not get recognized by the oscilloscope and therefore cannot be calibrated. The instrument uses an I2C interface to the probe to download the probe's specifications and characteristics.
The probe teardown reveals a simple I2C EEPROM IC. After removing the IC it becomes clear that the chip is damaged and must be replaced. A duplicate probe is used to copy the EEPROM data onto a new IC which revives the probe. With the help of the community, the CRC checksum code is discovered and the probe is assigned a new serial number.
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In this episode Shahriar review the new sampling oscilloscope from SJL Instruments. Our GigaWave™ digital sampling oscilloscopes offer 12-bit vertical resolution, 1-ps time resolution, and 6 GHz analog bandwidth, all in a tiny 4” form factor:
https://www.sjl-instruments.com/
This review is organized as follows:
00:00 - Introductions
00:34 - Sampling scope & real-time scope theory and comparison
04:13 - CDF versus PDF method of waveform reconstruction
06:12 - Teardown & circuit analysis
09:35 - Input return loss characteristics and channel isolation
10:36 - GUI overview, capturing a fast pulse, comparison with Keysight DCA-X, built-in measurements, dot and vector mode
19:09 - Eye diagram measurements, ISI measurements, multi-channel view
24:15 - Multi-tone capture, FFT functions
25:09 - Concluding remarks
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In this episode Shahriar reviews the newly released Siglent SVA1032X:
https://siglentna.com/product/sva1032x/
The SVA series instrument spectrum & vector network analyzers are powerful and flexible tools for broadcast and RF device / system testing. With a wide frequency range covering 9 kHz to 3.2 GHz, the analyzer delivers reliable automatic measurements and plenty of features including a tracking generator and multiple modes of operation. This review is organized as follows:
00:09 - Introduction and instrument overview
02:25 - Complete teardown and detailed analysis of the instrument hardware
23:36 - Basic instrument GUI operation and overload detection limitations
28:38 - Tracking generator signal purity and performance
30:06 - Instrument internal phase noise performance
33:01 - VNA operation and amplifier impedance tuning experiment
39:28 - Amplifier characterization using built-in functions
44:20 - Digital demodulation experiments
49:30 - Distance to fault experiments using built-in functions
49:16 - Concluding remarks
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